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CY7C1354C, CY7C1356C
9-Mbit (256 K x 36/512 K x 18) Pipelined SRAM with NoBLTM Architecture
9-Mbit (256 K x 36/512 K x 18) Pipelined SRAM with NoBLTM Architecture
Features

Functional Description
The CY7C1354C and CY7C1356C[1] are 3.3 V, 256 K x 36 and 512K x 18 synchronous pipelined burst SRAMs with No Bus LatencyTM (NoBL logic, respectively. They are designed to support unlimited true back-to-back read/write operations with no wait states. The CY7C1354C and CY7C1356C are equipped with the advanced (NoBL) logic required to enable consecutive read/write operations with data being transferred on every clock cycle. This feature greatly improves the throughput of data in systems that require frequent write/read transitions. The CY7C1354C and CY7C1356C are pin compatible and functionally equivalent to ZBT devices. All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. The clock input is qualified by the clock enable (CEN) signal, which when deasserted suspends operation and extends the previous clock cycle. Write operations are controlled by the byte write selects (BWa-BWd for CY7C1354C and BWa-BWb for CY7C1356C) and a write enable (WE) input. All writes are conducted with on-chip synchronous self-timed write circuitry. Three synchronous chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) provide for easy bank selection and output tristate control. To avoid bus contention, the output drivers are synchronously tristated during the data portion of a write sequence.
Pin-compatible and functionally equivalent to ZBT Supports 250 MHz bus operations with zero wait states Available speed grades are 250, 200, and 166 MHz Internally self-timed output buffer control to eliminate the need to use asynchronous OE Fully registered (inputs and outputs) for pipelined operation Byte write capability Single 3.3 V power supply (VDD) 3.3 V or 2.5 V I/O power supply (VDDQ) Fast clock-to-output times 2.8 ns (for 250 MHz device) Clock enable (CEN) pin to suspend operation Synchronous self-timed writes Available in Pb-free 100-pin TQFP package, Pb-free, and non Pb-free 119-ball BGA package and 165-ball FBGA package IEEE 1149.1 JTAG-compatible boundary scan Burst capability - linear or interleaved burst order "ZZ" sleep mode option and stop clock option

Logic Block Diagram - CY7C1354C (256 K x 36)
A0, A1, A MODE
CLK CEN
ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 A0' BURST D0 Q0 LOGIC ADV/LD C
WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2
C
ADV/LD
BW a BW b BW c BW d
WE
WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC
WRITE DRIVERS
MEMORY ARRAY
S E N S E A M P S
O U T P U T R E G I S T E R S
D A T A S T E E R I N G
O U T P U T B U F F E R S
E
DQ s DQ Pa DQ Pb DQ Pc DQ Pd
E
INPUT REGISTER 1
E
INPUT REGISTER 0
E
OE CE1 CE2 CE3
ZZ
READ LOGIC
SLEEP CONTROL
Note 1. For best-practices recommendations, refer to the Cypress application note System Design Guidelines on www.cypress.com.
Cypress Semiconductor Corporation Document Number: 38-05538 Rev. *K
*
198 Champion Court
*
San Jose, CA 95134-1709
* 408-943-2600 Revised March 2, 2011
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CY7C1354C, CY7C1356C
Logic Block Diagram - CY7C1356C (512 K x 18)
A0, A1, A MODE
CLK CEN
ADDRESS REGISTER 0 A1 A1' D1 Q1 A0 A0' BURST D0 Q0 LOGIC
ADV/LD C
WRITE ADDRESS REGISTER 1 WRITE ADDRESS REGISTER 2
C
ADV/LD
BW a
BW b WE
WRITE REGISTRY AND DATA COHERENCY CONTROL LOGIC
WRITE DRIVERS
MEMORY ARRAY
S E N S E A M P S
O U T P U T R E G I S T E R S
D A T A S T E E R I N G
O U T P U T B U F F E R S
DQ s DQ Pa DQ Pb
E
E
INPUT REGISTER 1
E
INPUT REGISTER 0
E
OE CE1 CE2 CE3 ZZ
READ LOGIC
Sleep Control
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Contents
Selection Guide ................................................................ 4 Pin Configurations ........................................................... 4 Pin Definitions .................................................................. 7 Functional Overview ........................................................ 8 Single Read Accesses ................................................ 8 Burst Read Accesses .................................................. 8 Single Write Accesses ................................................. 8 Burst Write Accesses .................................................. 9 Sleep Mode ................................................................. 9 Partial Write Cycle Description ..................................... 10 Truth Table ...................................................................... 10 Partial Write Cycle Description ..................................... 11 IEEE 1149.1 Serial Boundary Scan (JTAG) .................. 12 Disabling the JTAG Feature ...................................... 12 TAP Controller State Diagram ....................................... 12 Test Access Port (TAP) ............................................. 12 TAP Controller Block Diagram ...................................... 12 PERFORMING A TAP RESET .................................. 12 TAP REGISTERS ...................................................... 13 TAP Instruction Set ................................................... 13 TAP Timing ...................................................................... 14 TAP AC Switching Characteristics ............................... 14 3.3 V TAP AC Test Conditions ....................................... 15 3.3 V TAP AC Output Load Equivalent ......................... 15 2.5 V TAP AC Test Conditions ....................................... 15 2.5 V TAP AC Output Load Equivalent ......................... 15 TAP DC Electrical Characteristics and Operating Conditions ............................................. 15 Identification Register Definitions ................................ 15 Scan Register Sizes ....................................................... 16 Identification Codes ....................................................... 16 Boundary Scan Exit Order (256 K x 36) ........................ 17 Boundary Scan Exit Order (512 K x 18) ........................ 18 Maximum Ratings ........................................................... 19 Operating Range ............................................................. 19 Neutron Soft Error Immunity ......................................... 19 Electrical Characteristics ............................................... 19 Capacitance .................................................................... 20 Thermal Resistance ........................................................ 20 Switching Characteristics .............................................. 22 Switching Waveforms .................................................... 23 Ordering Information ...................................................... 26 Ordering Code Definitions ......................................... 26 Package Diagrams .......................................................... 27 Acronyms ........................................................................ 30 Document Conventions ................................................. 30 Units of Measure ....................................................... 30 Document History Page ................................................. 31 Sales, Solutions, and Legal Information ...................... 32 Worldwide Sales and Design Support ....................... 32 Products .................................................................... 32 PSoC Solutions ......................................................... 32
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Selection Guide
Description Maximum access time Maximum operating current Maximum CMOS standby current 250 MHz 2.8 250 40 200 MHz 3.2 220 40 166 MHz 3.5 180 40 Unit ns mA mA
Pin Configurations
Figure 1. 100-pin TQFP
A A CE1 CE2 BWd BWc BWb BWa CE3 VDD VSS CLK WE CEN OE ADV/LD NC(18) A
A A CE1 CE2 NC NC BWb BWa CE3 VDD VSS CLK WE CEN OE ADV/LD NC(18) A
NC DQPb NC DQb NC DQb VDDQ VDDQ VSS VSS NC DQb DQb NC DQb DQb DQb DQb VSS VSS VDDQ VDDQ DQb DQb DQb DQb NC VSS VDD NC VDD NC VSS ZZ DQb DQa DQa DQb VDDQ VDDQ VSS VSS DQa DQb DQa DQb DQa DQPb NC DQa VSS VSS VDDQ VDDQ NC DQa DQa NC DQPa NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
A A
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
DQPc DQc DQc VDDQ
VSS DQc DQc DQc DQc VSS VDDQ DQc DQc NC VDD VSS DQd DQd VDDQ VSS DQd DQd DQd DQd VSS VDDQ DQd DQd DQPd
NC
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
A A
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 A NC NC VDDQ VSS NC DQPa DQa DQa VSS VDDQ DQa DQa VSS NC VDD ZZ DQa DQa VDDQ VSS DQa DQa NC NC VSS VDDQ NC NC NC
CY7C1354C (256 K x 36)
80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51
CY7C1356C (512 K x 18)
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
NC(288) NC(144)
MODE A A A A A1 A0
MODE A A A A A1 A0
NC(36)
NC(288) NC(144)
NC(72)
NC(72)
NC(36)
VSS VDD
A A A A A A A
Document Number: 38-05538 Rev. *K
VSS VDD
A A A A A A A
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
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CY7C1354C, CY7C1356C
Figure 2. 119-ball BGA Pinout
CY7C1354C (256 K x 36)
1 A B C D E F G H J K L M N P R T U
VDDQ NC/576M NC/1G DQc DQc VDDQ DQc DQc VDDQ DQd DQd VDDQ DQd DQd NC/144M NC VDDQ
2
A CE2 A DQPc DQc DQc DQc DQc VDD DQd DQd DQd DQd DQPd A NC/72M TMS
3
A A A VSS VSS VSS BWc VSS NC VSS BWd VSS VSS VSS MODE A TDI
4
NC/18M ADV/LD VDD NC CE1 OE A WE VDD CLK NC CEN A1 A0 VDD A TCK
5
A A A VSS VSS VSS BWb VSS NC VSS BWa VSS VSS VSS NC A TDO
6
A CE3 A DQPb DQb DQb DQb DQb VDD DQa DQa DQa DQa DQPa A NC/36M NC
7
VDDQ NC NC DQb DQb VDDQ DQb DQb VDDQ DQa DQa VDDQ DQa DQa NC/288M ZZ VDDQ
CY7C1356C (512 K x 18)
1 A B C D E F G H J K L M N P R T U
VDDQ NC/576M NC/1G DQb NC VDDQ NC DQb VDDQ NC DQb VDDQ DQb NC NC/144M NC/72M VDDQ
2
A CE2 A NC DQb NC DQb NC VDD DQb NC DQb NC DQPb A A TMS
3
A A A VSS VSS VSS BWb VSS NC VSS VSS VSS VSS VSS MODE A TDI
4
NC/18M ADV/LD VDD NC CE1 OE A WE VDD CLK NC CEN A1 A0 VDD NC/36M TCK
5
A A A VSS VSS VSS VSS VSS NC VSS BWa VSS VSS VSS NC A TDO
6
A CE3 A DQPa NC DQa NC DQa VDD NC DQa NC DQa NC A A NC
7
VDDQ NC NC NC DQa VDDQ DQa NC VDDQ DQa NC VDDQ NC DQa NC/288M ZZ VDDQ
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CY7C1354C, CY7C1356C
Figure 3. 165-ball FBGA
1 A B C D E F G H J K L M N P R
NC/576M NC/1G DQPc DQc DQc DQc DQc NC DQd DQd DQd DQd DQPd MODE
2
A
3
CE1 CE2 VDDQ VDDQ VDDQ VDDQ VDDQ NC VDDQ VDDQ VDDQ VDDQ VDDQ A A
CY7C1354C (256 K x 36) 4 5 6 7
BWc BWd VSS VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS
A
8
ADV/LD
9
A NC/18M
10
A
11
NC NC DQPb DQb DQb DQb DQb ZZ DQa DQa DQa DQa DQPa NC/288M A
BWb BWa VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDI
TMS
CE3 CLK
A NC DQc
DQc DQc DQc NC DQd DQd DQd DQd NC NC/36M
CEN WE
OE
A
NC DQb DQb DQb DQb NC DQa DQa DQa DQa NC A A
VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC A1 A0
VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDO TCK
VSS VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS
A
VDDQ VDDQ VDDQ VDDQ VDDQ
NC
VDDQ VDDQ VDDQ VDDQ VDDQ A
A
NC/144M NC/72M
A
A
CY7C1356C (512 K x 18)
1 A B C D E F G H J K L M N P R
NC/576M NC/1G NC NC NC NC NC NC DQb DQb DQb DQb DQPb MODE
2
A
3
CE1 CE2 VDDQ VDDQ VDDQ VDDQ VDDQ NC VDDQ VDDQ VDDQ VDDQ VDDQ A A
4
BWb NC VSS VDD VDD VDD VDD VDD VDD VDD VDD VDD VSS
A
5
NC BWa VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC TDI
TMS
6
CE3 CLK
7
CEN WE VSS VSS
8
ADV/LD
9
A NC/18M
10
A A NC NC NC NC NC NC DQa DQa DQa DQa NC A A
11
A NC DQPa DQa DQa DQa DQa ZZ NC NC NC NC NC NC/288M A
A NC DQb
DQb DQb DQb NC NC NC NC NC NC NC/36M
VSS VSS VSS VSS VSS VSS VSS VSS VSS VSS NC A1 A0
OE VSS VDD
VDDQ VDDQ VDDQ VDDQ VDDQ
NC
VSS VSS VSS VSS VSS VSS VSS VSS NC TDO TCK
VDD VDD VDD VDD VDD VDD VDD VDD VSS
A
VDDQ VDDQ VDDQ VDDQ VDDQ A
A
NC/144M NC/72M
A
A
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Pin Definitions
Pin Name A0, A1, A BWa,BWb, BWc,BWd, WE ADV/LD I/O Type Inputsynchronous Inputsynchronous Inputsynchronous Inputsynchronous Pin Description Address inputs used to select one of the address locations. Sampled at the rising edge of the CLK. Byte write select inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising edge of CLK. BWa controls DQa and DQPa, BWb controls DQb and DQPb, BWc controls DQc and DQPc, BWd controls DQd and DQPd. Write enable input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal must be asserted LOW to initiate a write sequence. Advance/load input used to advance the on-chip address counter or load a new address. When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW to load a new address. Clock input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. Chip enable 1 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 to select/deselect the device. Chip enable 2 input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. Chip enable 3 input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device.
CLK CE1 CE2 CE3 OE
Inputclock Inputsynchronous Inputsynchronous Inputsynchronous
InputOutput enable, active LOW. Combined with the synchronous logic block inside the device to asynchronous control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are tristated, and act as input data pins. OE is masked during the data portion of a Write sequence, during the first clock when emerging from a deselected state and when the device has been deselected. Inputsynchronous I/Osynchronous Clock enable input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. Bidirectional data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by addresses during the previous clock rise of the read cycle. The direction of the pins is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, DQa-DQd are placed in a tristate condition. The outputs are automatically tristated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. Bidirectional data parity I/O lines. Functionally, these signals are identical to DQ[a:d]. During write sequences, DQPa is controlled by BWa, DQPb is controlled by BWb, DQPc is controlled by BWc, and DQPd is controlled by BWd.
CEN
DQS
DQPX
I/Osynchronous
MODE
Input strap pin Mode input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order. Pulled LOW selects the linear burst order. MODE should not change states during operation. When left floating MODE will default HIGH, to an interleaved burst order. JTAG serial output synchronous Serial data out to the JTAG circuit. Delivers data on the negative edge of TCK.
TDO
TDI TMS TCK VDD
JTAG serial input Serial data in to the JTAG circuit. Sampled on the rising edge of TCK. synchronous Test mode select This pin controls the test access port state machine. Sampled on the rising edge of TCK. synchronous JTAG-clock Power supply Clock input to the JTAG circuitry. Power supply inputs to the core of the device.
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Pin Definitions
Pin Name VDDQ VSS NC NC (18, 36, 72, 144, 288, 576, 1G) ZZ
(continued) Pin Description Ground for the device. Should be connected to ground of the system. No connects. This pin is not connected to the die. These pins are not connected. They will be used for expansion to the 18M, 36M, 72M, 144M 288M, 576M, and 1G densities.
I/O Type I/O power supply Power supply for the I/O circuitry. Ground - -
InputZZ "sleep" Input. This active HIGH input places the device in a non-time-critical "sleep" asynchronous condition with data integrity preserved. For normal operation, this pin has to be LOW or left floating. ZZ pin has an internal pull-down.
Functional Overview
The CY7C1354C and CY7C1356C are synchronous-pipelined burst NoBL SRAMs designed specifically to eliminate wait states during write/read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the clock enable input signal (CEN). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (tCO) is 2.8 ns (250 MHz device). Accesses can be initiated by asserting all three chip enables (CE1, CE2, CE3) active at the rising edge of the clock. If clock enable (CEN) is active LOW and ADV/LD is asserted LOW, the address presented to the device will be latched. The access can either be a read or write operation, depending on the status of the write enable (WE). BW[d:a] can be used to conduct byte write operations. Write operations are qualified by the write enable (WE). All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous chip enables (CE1, CE2, CE3) and an asynchronous output enable (OE) simplify depth expansion. All operations (reads, writes, and deselects) are pipelined. ADV/LD should be driven LOW once the device has been deselected to load a new address for the next operation. operation (read/write/deselect) can be initiated. Deselecting the device is also pipelined. Therefore, when the SRAM is deselected at clock rise by one of the chip enable signals, its output tristates following the next clock rise.
Burst Read Accesses
The CY7C1354C and CY7C1356C have an on-chip burst counter that enables the user the ability to supply a single address and conduct up to four reads without reasserting the address inputs. ADV/LD must be driven LOW to load a new address into the SRAM, as described in the Single Read Accesses section. The sequence of the burst counter is determined by the MODE input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst sequence, and wrap around when incremented sufficiently. A HIGH input on ADV/LD increments the internal burst counter regardless of the state of chip enables inputs or WE. WE is latched at the beginning of a burst cycle. Therefore, the type of access (read or write) is maintained throughout the burst sequence.
Single Write Accesses
Write accesses are initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, and (3) the write signal WE is asserted LOW. The address presented to A0-A16 is loaded into the address register. The write signals are latched into the control logic block. On the subsequent clock rise the data lines are automatically tristated regardless of the state of the OE input signal. This enables the external logic to present the data on DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1354C and DQa,b/DQPa,b for CY7C1356C). In addition, the address for the subsequent access (read/write/deselect) is latched into the address register if the appropriate control signals are asserted. On the next clock rise the data presented to DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1354C and DQa,b/DQPa,b for CY7C1356C or a subset for byte write operations, see the table Partial Write Cycle Description on page 10 for details) inputs is latched into the device and the write is complete.
Single Read Accesses
A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are all asserted active, (3) the write enable input signal WE is deasserted HIGH, and (4) ADV/LD is asserted LOW. The address presented to the address inputs is latched into the address register and presented to the memory core and control logic. The control logic determines that a read access is in progress and enables the requested data to propagate to the input of the output register. At the rising edge of the next clock the requested data is allowed to propagate through the output register and to the data bus within 2.8 ns (250 MHz device) provided OE is active LOW. After the first clock of the read access the output buffers are controlled by OE and the internal control logic. OE must be driven LOW for the device to drive out the requested data. During the second clock, a subsequent
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
The data written during the write operation is controlled by BW (BWa,b,c,d for CY7C1354C and BWa,b for CY7C1356C) signals. The CY7C1354C/CY7C1356C provides byte write capability that is described in the Write Cycle Description table. Asserting the write enable input (WE) with the selected byte write select (BW) input will selectively write to only the desired bytes. Bytes not selected during a byte write operation remain unaltered. A synchronous self-timed write mechanism is provided to simplify the write operations. Byte write capability is included to greatly simplify read/modify/write sequences, which can be reduced to simple byte write operations. Because the CY7C1354C and CY7C1356C are common I/O devices, data should not be driven into the device while the outputs are active. The output enable (OE) can be deasserted HIGH before presenting data to the DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1354C and DQa,b/DQPa,b for CY7C1356C) inputs. Doing so will tristate the output drivers. As a safety precaution, DQ and DQP (DQa,b,c,d/DQPa,b,c,d for CY7C1354C and DQa,b/DQPa,b for CY7C1356C) are automatically tristated during the data portion of a write cycle, regardless of the state of OE.
Sleep Mode
The ZZ input pin is an asynchronous input. Asserting ZZ places the SRAM in a power conservation `sleep' mode. Two clock cycles are required to enter into or exit from this `sleep' mode. While in this mode, data integrity is guaranteed. Accesses pending when entering the "sleep" mode are not considered valid nor is the completion of the operation guaranteed. The device must be deselected prior to entering the "sleep" mode. CE1, CE2, and CE3, must remain inactive for the duration of tZZREC after the ZZ input returns LOW. Table 1. Interleaved Burst Address Table (MODE = Floating or VDD) First Address A1, A0 00 01 10 11 Second Address A1, A0 01 00 11 10 Third Address A1, A0 10 11 00 01 Fourth Address A1, A0 11 10 01 00
Burst Write Accesses
The CY7C1354C/CY7C1356C has an on-chip burst counter that enables the user the ability to supply a single address and conduct up to four write operations without reasserting the address inputs. ADV/LD must be driven LOW to load the initial address, as described in Single Write Accesses on page 8. When ADV/LD is driven HIGH on the subsequent clock rise, the chip enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BW (BWa,b,c,d for CY7C1354C and BWa,b for CY7C1356C) inputs must be driven in each cycle of the burst write to write the correct bytes of data. Table 3. ZZ Mode Electrical Characteristics Parameter IDDZZ tZZS tZZREC tZZI tRZZI Description Sleep mode standby current Device operation to ZZ ZZ recovery time ZZ active to sleep current ZZ Inactive to exit sleep current
Table 2. Linear Burst Address Table (MODE = GND) First Address A1, A0 00 01 10 11 Second Address A1, A0 01 10 11 00 Third Address A1, A0 10 11 00 01 Fourth Address A1, A0 11 00 01 10
Test Conditions ZZ VDD 0.2 V ZZVDD 0.2 V ZZ 0.2 V This parameter is sampled This parameter is sampled
Min - - 2tCYC - 0
Max 50 2tCYC - 2tCYC -
Unit mA ns ns ns ns
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Truth Table
The Truth Table for CY7C1354C and CY7C1356C follows. [2, 3, 4, 5, 6, 7, 8] Operation Deselect cycle Continue deselect cycle Read cycle (begin burst) Read cycle (continue burst) NOP/dummy read (begin burst) Dummy read (continue burst) Write cycle (begin burst) Write cycle (continue burst) NOP/WRITE ABORT (begin burst) WRITE ABORT (continue burst) IGNORE CLOCK EDGE (stall) SLEEP MODE Address Used None None External Next External Next External Next None Next Current None CE ZZ H X L X L X L X L X X X L L L L L L L L L L L H ADV/LD L H L H L H L H L H X X WE X X H X H X L X L X X X BWx X X X X X X L L H H X X OE X X L L H H X X X X X X CEN CLK L L L L L L L L L L H X L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H L-H X DQ Tri-state Tri-state Data out (Q) Data out (Q) Tri-state Tri-state Data in (D) Data in (D) Tri-state Tri-state Tri-state
Partial Write Cycle Description
The following table lists the Partial Write Cycle Description for CY7C1354C.[2, 3, 4, 9] Function (CY7C1354C) Read Write- no bytes written Write byte a -(DQa and DQPa) Write byte b - (DQb and DQPb) Write bytes b, a Write byte c -(DQc and DQPc) Write bytes c, a Write bytes c, b Write bytes c, b, a Write byte d -(DQd and DQPd) Write bytes d, a Write bytes d, b Write bytes d, b, a Write bytes d, c Write bytes d, c, a Write bytes d, c, b Write all bytes WE H L L L L L L L L L L L L L L L L BWd X H H H H H H H H L L L L L L L L BWc X H H H H L L L L H H H H L L L L BWb X H H L L H H L L H H L L H H L L BWa X H L H L H L H L H L H L H L H L
Notes 2. X = "Don't Care", H = Logic HIGH, L = Logic LOW, CE stands for all chip enables active. BWx = L signifies at least one bytewrite select is active, BWx = valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details. 3. Write is defined by WE and BWX. See Write Cycle Description table for details. 4. When a write cycle is detected, all I/Os are tri-stated, even during byte writes. 5. The DQ and DQP pins are controlled by the current cycle and the OE signal. 6. CEN = H inserts wait states. 7. Device will power up deselected and the I/Os in a tri-state condition, regardless of OE. 8. OE is asynchronous and is not sampled with the clock rise. It is masked internally during write cycles. During a read cycle DQs and DQPX = tri-state when OE is inactive or when the device is deselected, and DQs = data when OE is active. 9. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write will be done based on which byte write is active.
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Partial Write Cycle Description
The following table lists the Partial Write Cycle Description for CY7C1356C.[10, 11, 12, 13] Function (CY7C1356C) Read Write - no bytes written Write byte a (DQa and DQPa) Write byte b - (DQb and DQPb) Write both bytes WE H L L L L BWb x H H L L BWa x H L H L
Notes 10. X = "Don't Care", H = Logic HIGH, L = Logic LOW, CE stands for all chip enables active. BWx = L signifies at least one bytewrite select is active, BWx = valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details. 11. Write is defined by WE and BWX. See Write Cycle Description table for details. 12. When a write cycle is detected, all I/Os are tri-stated, even during byte writes. 13. Table only lists a partial listing of the byte write combinations. Any combination of BWX is valid. Appropriate write will be done based on which byte write is active.
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IEEE 1149.1 Serial Boundary Scan (JTAG)
The CY7C1354C/CY7C1356C incorporates a serial boundary scan test access port (TAP) in the BGA package only. The TQFP package does not offer this functionality. This part operates in accordance with IEEE Standard 1149.1-1900, but does not have the set of functions required for full 1149.1 compliance. These functions from the IEEE specification are excluded because their inclusion places an added delay in the critical speed path of the SRAM. Note that the TAP controller functions in a manner that does not conflict with the operation of other devices using 1149.1 fully compliant TAPs. The TAP operates using JEDEC-standard 3.3 V or 2.5 V I/O logic levels. The CY7C1354C/CY7C1356C contains a TAP controller, instruction register, boundary scan register, bypass register, and ID register.
Test Access Port (TAP)
Test Clock (TCK) The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select (TMS) The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this ball unconnected if the TAP is not used. The ball is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI ball is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the most significant bit (MSB) of any register. (See the TAP Controller Block Diagram.) Test Data-Out (TDO) The TDO output ball is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine. The output changes on the falling edge of TCK. TDO is connected to the least significant bit (LSB) of any register. (See the TAP Controller State Diagram.)
Disabling the JTAG Feature
It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull up resistor. TDO should be left unconnected. Upon power-up, the device comes up in a reset state which does not interfere with the operation of the device.
TAP Controller State Diagram
1 TEST-LOGIC RESET 0 0 RUN-TEST/ IDLE 1 SELECT DR-SCA N 0 1 CAPTURE-DR 0 SHIFT-DR 1 EXIT1-DR 0 PAUSE-DR 1 0 EXIT2-DR 1 UPDATE-DR 1 0 0 0 1 0 1 1 SELECT IR-SCAN 0 CAPTURE-IR 0 SHIFT-IR 1 EXIT1-IR 0 PAUSE-IR 1 EXIT2-IR 1 UPDATE-IR 1 0 0 1 0 1
TAP Controller Block Diagram
0 Bypass Register
210
TDI
Selection Circuitry
Instruction Register
31 30 29 . . . 2 1 0
Selection Circuitry
TDO
Identification Register
x. . . . .210
Boundary Scan Register
TCK TM S
TAP CONTROLLER
Performing a TAP Reset
A RESET is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a high Z state.
The 0/1 next to each state represents the value of TMS at the rising edge of TCK.
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TAP Registers
Registers are connected between the TDI and TDO balls and enable data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the instruction register. Data is serially loaded into the TDI ball on the rising edge of TCK. Data is output on the TDO ball on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO balls as shown in the TAP Controller Block Diagram on page 12. Upon power up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the Capture-IR state, the two least significant bits are loaded with a binary "01" pattern to enable fault isolation of the board-level serial test data path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain chips. The bypass register is a single-bit register that can be placed between the TDI and TDO balls. This enables data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and bidirectional balls on the SRAM. The boundary scan register is loaded with the contents of the RAM I/O ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO balls when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the I/O ring. The tables Boundary Scan Exit Order (256 K x 36) on page 17 and Boundary Scan Exit Order (512 K x 18) on page 18 show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI and the LSB is connected to TDO. Identification (ID) Register The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in Identification Register Definitions on page 15. The TAP controller used in this SRAM is not fully compliant to the 1149.1 convention because some of the mandatory 1149.1 instructions are not fully implemented. The TAP controller cannot be used to load address data or control signals into the SRAM and cannot preload the I/O buffers. The SRAM does not implement the 1149.1 commands EXTEST or INTEST or the PRELOAD portion of SAMPLE/PRELOAD; rather, it performs a capture of the I/O ring when these instructions are executed. Instructions are loaded into the TAP controller during the Shift-IR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO balls. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. EXTEST EXTEST is a mandatory 1149.1 instruction which is to be executed whenever the instruction register is loaded with all 0s. EXTEST is not implemented in this SRAM TAP controller, and therefore this device is not compliant to 1149.1. The TAP controller does recognize an all-0 instruction. When an EXTEST instruction is loaded into the instruction register, the SRAM responds as if a SAMPLE/PRELOAD instruction has been loaded. There is one difference between the two instructions. Unlike the SAMPLE/PRELOAD instruction, EXTEST places the SRAM outputs in a high Z state. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO balls and enables the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power up or whenever the TAP controller is given a test logic reset state. SAMPLE Z The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO balls when the TAP controller is in a Shift-DR state. It also places all SRAM outputs into a High-Z state. SAMPLE/PRELOAD SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When the SAMPLE/PRELOAD instructions are loaded into the instruction register and the TAP controller is in the Capture-DR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. The user must be aware that the TAP controller clock can only operate at a frequency up to 20 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This does not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible.
TAP Instruction Set
Overview Eight different instructions are possible with the three-bit instruction register. All combinations are listed in the Instruction Codes table. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail in this section.
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To guarantee that the boundary scan register captures the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller's capture setup plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE/PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK# captured in the boundary scan register. After the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. PRELOAD enables an initial data pattern to be placed at the latched parallel outputs of the boundary scan register cells prior to the selection of another boundary scan test operation. The shifting of data for the SAMPLE and PRELOAD phases can occur concurrently when required - that is, while data captured is shifted out, the preloaded data can be shifted in. BYPASS When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO balls. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. Reserved These instructions are not implemented but are reserved for future use. Do not use these instructions.
TAP Timing
1 Test Clock (TCK )
t TM SS
2
3
4
5
6
t TH t TM SH
t
TL
t CY C
Test M ode Select (TM S)
t TDIS t TDIH
Test Data-In (TDI)
t TDOV t TDOX
Test Data-Out (TDO) DON'T CA RE UNDEFINED
TAP AC Switching Characteristics
Over the Operating Range[14, 15] Parameter Description Clock TCK clock cycle time tTCYC TCK clock frequency tTF TCK clock HIGH time tTH TCK clock LOW time tTL Output Times TCK clock LOW to TDO valid tTDOV TCK clock LOW to TDO invalid tTDOX Setup Times TMS setup to TCK clock rise tTMSS TDI setup to TCK clock rise tTDIS Capture setup to TCK rise tCS Hold Times TMS hold after TCK clock rise tTMSH TDI hold after clock rise tTDIH Capture hold after clock rise tCH
Notes 14. tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register. 15. Test conditions are specified using the load in TAP AC test Conditions. tR/tF = 1 ns.
Min 50 - 20 20 - 0 5 5 5 5 5 5
Max - 20 - - 10 - - - - - - -
Unit ns MHz ns ns ns ns ns ns ns ns ns ns
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3.3 V TAP AC Test Conditions
Input pulse levels ............................................... VSS to 3.3 V Input rise and fall times ................................................... 1 ns Input timing reference levels ......................................... 1.5 V Output reference levels ................................................. 1.5 V Test load termination supply voltage ............................. 1.5 V
2.5 V TAP AC Test Conditions
Input pulse levels ................................................VSS to 2.5 V Input rise and fall time..................................................... 1 ns Input timing reference levels........................................ 1.25 V Output reference levels................................................ 1.25 V Test load termination supply voltage............................ 1.25 V
3.3 V TAP AC Output Load Equivalent
1.5V 50 TDO Z O= 50 20pF
2.5 V TAP AC Output Load Equivalent
1.25V 50 TDO Z O= 50 20pF
TAP DC Electrical Characteristics and Operating Conditions
(0 C < TA < +70 C; VDD = 3.3 V 0.165 V unless otherwise noted)[16] Parameter VOH1 VOH2 VOL1 VOL2 VIH VIL IX Description Output HIGH voltage Output HIGH voltage Output LOW voltage Output LOW voltage Input HIGH voltage Input LOW voltage Input load current GND < VIN < VDDQ Test Conditions IOH = -4.0 mA, VDDQ = 3.3 V IOH = -1.0 mA, VDDQ = 2.5 V IOH = -100 A IOL = 8.0 mA IOL = 100 A VDDQ = 3.3 V VDDQ = 2.5 V VDDQ = 3.3 V VDDQ = 2.5 V VDDQ = 3.3 V VDDQ = 2.5 V VDDQ = 3.3 V VDDQ = 2.5 V VDDQ = 3.3 V VDDQ = 2.5 V Min 2.4 2.0 2.9 2.1 - - - - 2.0 1.7 -0.3 -0.3 -5 Max - - - - 0.4 0.4 0.2 0.2 VDD + 0.3 VDD + 0.3 0.8 0.7 5 Unit V V V V V V V V V V V V A
Identification Register Definitions
Instruction Field Revision number (31:29) Cypress device ID (28:12)[17] Cypress JEDEC ID (11:1) ID register presence (0) CY7C1354C 000 01011001000100110 00000110100 1 CY7C1356C 000 00000110100 1 Description Reserved for version number. Allows unique identification of SRAM vendor. Indicate the presence of an ID register.
01011001000010110 Reserved for future use.
Notes 16. All voltages referenced to VSS (GND). 17. Bit #24 is "1" in the Register Definitions for both 2.5 V and 3.3 V versions of this device.
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Scan Register Sizes
Register Name Instruction Bypass ID Boundary scan order (119-ball BGA package) Boundary scan order (165-ball FBGA package) Bit Size (x 36) 3 1 32 69 69 Bit Size (x 18) 3 1 32 69 69
Identification Codes
Instruction EXTEST IDCODE SAMPLE Z RESERVED SAMPLE/PRELOAD RESERVED RESERVED BYPASS Code Description 000 Captures the input/output ring contents. Places the boundary scan register between the TDI and TDO. Forces all SRAM outputs to high Z state. 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operation. 010 Captures the input/output contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a high Z state. 011 Do Not Use: This instruction is reserved for future use. 100 Captures the input/output ring contents. Places the boundary scan register between TDI and TDO. Does not affect the SRAM operation. 101 Do Not Use: This instruction is reserved for future use. 110 Do Not Use: This instruction is reserved for future use. 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operation.
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Boundary Scan Exit Order (256 K x 36)
Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 119-ball ID K4 H4 M4 F4 B4 G4 C3 B3 D6 H7 G6 E6 D7 E7 F6 G7 H6 T7 K7 L6 N6 P7 N7 M6 L7 K6 P6 T4 A3 C5 165-ball ID B6 B7 A7 B8 A8 A9 B10 A10 C11 E10 F10 G10 D10 D11 E11 F11 G11 H11 J10 K10 L10 M10 J11 K11 L11 M11 N11 R11 R10 P10 Bit # 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 119-ball ID B5 A5 C6 A6 P4 N4 R6 T5 T3 R2 R3 P2 P1 L2 K1 N2 N1 M2 L1 K2 Not Bonded (Preset to 1) H1 G2 E2 D1 H2 G1 F2 E1 D2 C2 165-ball ID R9 P9 R8 P8 R6 P6 R4 P4 R3 P3 R1 N1 L2 K2 J2 M2 M1 L1 K1 J1 Not Bonded (Preset to 1) G2 F2 E2 D2 G1 F1 E1 D1 C1 B2
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Boundary Scan Exit Order (512 K x 18)
Bit # 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 119-ball ID K4 H4 M4 F4 B4 G4 C3 B3 T2 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) D6 E7 F6 G7 H6 T7 K7 L6 N6 P7 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) T6 A3 C5 B5 A5 C6 A6 P4 N4 165-ball ID B6 B7 A7 B8 A8 A9 B10 A10 A11 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) C11 D11 E11 F11 G11 H11 J10 K10 L10 M10 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) R11 R10 P10 R9 P9 R8 P8 R6 P6 Bit # 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 119-ball ID R6 T5 T3 R2 R3 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) P2 N1 M2 L1 K2 Not Bonded (Preset to 1) H1 G2 E2 D1 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) C2 A2 E4 B2 Not Bonded (Preset to 0) G3 Not Bonded (Preset to 0) L5 B6 165-ball ID R4 P4 R3 P3 R1 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) N1 M1 L1 K1 J1 Not Bonded (Preset to 1) G2 F2 E2 D2 Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) Not Bonded (Preset to 0) B2 A2 A3 B3 Not Bonded (Preset to 0) Not Bonded (Preset to 0) A4 B5 A6
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Maximum Ratings
Exceeding maximum ratings may impair the useful life of the device. These user guidelines are not tested. Storage temperature ................................ -65 C to +150 C Ambient temperature with power applied ........................................... -55 C to +125 C Supply voltage on VDD relative to GND ........-0.5 V to +4.6 V Supply voltage on VDDQ relative to GND....... -0.5 V to +VDD DC to outputs in tri-state ....................-0.5 V to VDDQ + 0.5 V DC input voltage .................................. -0.5 V to VDD + 0.5 V Current into outputs (LOW) ......................................... 20 mA Static discharge voltage........................................... > 2001 V (per MIL-STD-883, method 3015) Latch-up current ..................................................... > 200 mA SEL LMBU
Neutron Soft Error Immunity
Parameter LSBU Description Logical single-bit upsets Logical multi-bit upsets Single event latch-up Test Condi- Typ tions 25 C 320 Max* 368 Unit FIT/ Mb FIT/ Mb FIT/ Dev
25 C
0
0.01
85 C
0
0.1
* No LMBU or SEL events occurred during testing; this column represents a statistical 2, 95% confidence limit calculation. For more details refer to Application Note AN 54908 "Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates".
Operating Range
Range Commercial Industrial Ambient Temperature 0 C to +70 C -40 C to +85 C VDD 3.3 V- 5% / + 10% VDDQ 2.5 V - 5% to VDD
Electrical Characteristics
Over the Operating Range[18, 19] Parameter VDD VDDQ VOH VOL VIH VIL IX Description Power supply voltage I/O supply voltage Output HIGH voltage Output LOW voltage Input HIGH voltage Input LOW voltage[20] Input leakage current except ZZ and MODE Input current of MODE Input current of ZZ IOZ for 3.3 V I/O for 2.5 V I/O for 3.3 V I/O, IOH =4.0 mA for 2.5 V I/O, IOH =1.0 mA for 3.3 V I/O, IOL=8.0 mA for 2.5 V I/O, IOL=1.0 mA for 3.3 V I/O for 2.5 V I/O for 3.3 V I/O for 2.5 V I/O GND VI VDDQ Input = VSS Input = VDD Input = VSS Input = VDD Output leakage current GND VI VDDQ, output disabled Test Conditions Min 3.135 3.135 2.375 2.4 2.0 - - 2.0 1.7 -0.3 -0.3 -5 -30 - -5 - -5 Max 3.6 VDD 2.625 - - 0.4 0.4 VDD + 0.3 V VDD + 0.3 V 0.8 0.7 5 - 5 - 30 5 Unit V V V V V V V V V V V A A A A A A
Notes 18. Overshoot: VIH(AC) < VDD + 1.5 V (Pulse width less than tCYC/2), undershoot: VIL(AC) > -2 V (Pulse width less than tCYC/2). 19. TPower-up: Assumes a linear ramp from 0 V to VDD (min) within 200 ms. During this time VIH < VDD and VDDQ Document Number: 38-05538 Rev. *K
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Electrical Characteristics
Over the Operating Range[18, 19] (continued) Parameter IDD Description VDD operating supply Test Conditions VDD = Max, IOUT = 0 mA, f = fMAX = 1/tCYC 4 ns cycle, 250 MHz 5 ns cycle, 200 MHz 6 ns cycle, 166 MHz ISB1 Automatic CE power-down current--TTL inputs Automatic CE power-down current--CMOS inputs Automatic CE power-down current--CMOS inputs Automatic CE power-down current--TTL inputs Max VDD, device deselected, VIN 4 ns cycle, 250 MHz VIH or VIN VIL, 5 ns cycle, 200 MHz f = fMAX = 1/tCYC 6 ns cycle, 166 MHz Max VDD, device deselected, All speed grades VIN 0.3 V or VIN > VDDQ 0.3 V, f=0 Max VDD, device deselected, 4 ns cycle, 250 MHz VIN 0.3 V or VIN > VDDQ 0.3 V, 5 ns cycle, 200 MHz f = fMAX = 1/tCYC 6 ns cycle, 166 MHz Max VDD, device deselected, VIN VIH or VIN VIL, f = 0 All speed grades Min - - - - - - - Max 250 220 180 130 120 110 40 Unit mA mA mA mA mA mA mA
ISB2 ISB3
- - - -
120 110 100 40
mA mA mA mA
ISB4
Capacitance[21]
Parameter CIN CCLK CI/O Description Input capacitance Test Conditions 100 TQFP Max 5 5 5 119 BGA Max 5 5 7 165 FBGA Max 5 5 7 Unit pF pF pF TA = 25 C, f = 1 MHz, VDD = 3.3 V VDDQ = 2.5 V Clock input capacitance Input/output capacitance
Thermal Resistance[21]
Parameter JA JC Description Thermal resistance (junction to ambient) Thermal resistance (junction to case) Test Conditions Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA/JESD51. 100 TQFP Max 29.41 6.13 119 BGA Max 34.1 14.0 165 FBGA Max 16.8 3.0 Unit C/W C/W
Note 21. Tested initially and after any design or process changes that may affect these parameters.
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Figure 4. AC Test Loads and Waveforms 3.3 V I/O Test Load
OUTPUT Z0 = 50 3.3 V OUTPUT RL = 50 R = 317 VDDQ 5 pF GND R = 351 10%
ALL INPUT PULSES 90% 90% 10% 1 ns
VT = 1.5 V
(a) 2.5 V I/O Test Load
OUTPUT Z0 = 50
INCLUDING JIG AND SCOPE
1 ns
(b)
R = 1667 VDDQ
(c)
2.5 V OUTPUT RL = 50 VT = 1.25 V
ALL INPUT PULSES 10% 90% 90% 10% 1 ns
5 pF
GND R = 1538
(a)
INCLUDING JIG AND SCOPE
1 ns
(b)
(c)
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Switching Characteristics
Over the Operating Range [22, 23] Parameter tPower[24] Clock tCYC FMAX tCH tCL tEOV tCLZ Output Times tCO tEOV tDOH tCHZ tCLZ tEOHZ tEOLZ Setup Times tAS tDS tCENS tWES tALS tCES Hold Times tAH tDH tCENH tWEH tALH tCEH Address hold after CLK rise Data input hold after CLK rise CEN hold after CLK rise WE, BWx hold after CLK rise ADV/LD hold after CLK rise Chip select hold after CLK rise 0.4 0.4 0.4 0.4 0.4 0.4 - - - - - - 0.5 0.5 0.5 0.5 0.5 0.5 - - - - - - 0.5 0.5 0.5 0.5 0.5 0.5 - - - - - - ns ns ns ns ns ns Address setup before CLK rise Data input setup before CLK rise CEN setup before CLK rise WE, BWx setup before CLK rise ADV/LD setup before CLK rise Chip select setup 1.4 1.4 1.4 1.4 1.4 1.4 - - - - - - 1.5 1.5 1.5 1.5 1.5 1.5 - - - - - - 1.5 1.5 1.5 1.5 1.5 1.5 - - - - - - ns ns ns ns ns ns Data output valid after CLK rise OE LOW to output valid Data output hold after CLK rise Clock to high Z[25, 26, 27] Clock to low Z[25, 26, 27] OE HIGH to output high OE LOW to output low Z Z[25, 26, 27]
[25, 26, 27]
Description VCC (typical) to the first access read or write Clock cycle time Maximum operating frequency Clock HIGH Clock LOW OE LOW to output valid Clock to low Z[25, 26, 27]
-250 Min 1 4.0 - 1.8 1.8 - 1.25 - - 1.25 1.25 1.25 - 0 Max - - 250 - - 2.8 - 2.8 2.8 - 2.8 - 2.8 - Min 1 5 - 2.0 2.0 - 1.5 - - 1.5 1.5 1.5 - 0
-200 Max - - 200 - - 3.2 - 3.2 3.2 - 3.2 - 3.2 - Min 1 6 - 2.4 2.4 - 1.5 - - 1.5 1.5 1.5 - 0
-166 Max - - 166 - - 3.5 - 3.5 3.5 - 3.5 - 3.5 -
Unit ms ns MHz ns ns ns ns ns ns ns ns ns ns ns
Notes 22. Timing reference level is 1.5 V when VDDQ = 3.3 V and is 1.25 V when VDDQ = 2.5 V. 23. Test conditions shown in (a) of Figure 4 on page 21 unless otherwise noted. 24. This part has a voltage regulator internally; tpower is the time power needs to be supplied above VDD minimum initially, before a Read or Write operation can be initiated. 25. tCHZ, tCLZ, tEOLZ, and tEOHZ are specified with AC test conditions shown in (b) of AC Test Loads. Transition is measured 200 mV from steady-state voltage. 26. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve high Z prior to low Z under the same system conditions. 27. This parameter is sampled and not 100% tested.
Document Number: 38-05538 Rev. *K
Page 22 of 32
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CY7C1354C, CY7C1356C
Switching Waveforms
Figure 5. Read/Write Timing[28, 29, 30]
1 CLK
t CENS t CENH
2
t CYC
3
4
5
6
7
8
9
10
t CH
t CL
CEN
t CES t CEH
CE ADV/LD WE BW x ADDRESS
t AS
A1
t AH
A2
t DS t DH
A3
A4
t CO t CLZ t DOH
A5
t OEV
A6
t CHZ
A7
Data In-Out (DQ) OE
WRITE D(A1) WRITE D(A2)
D(A1)
D(A2)
D(A2+1)
Q(A3)
Q(A4)
t OEHZ
Q(A4+1)
D(A5)
Q(A6)
t DOH t OELZ
BURST WRITE D(A2+1)
READ Q(A3)
READ Q(A4)
BURST READ Q(A4+1)
WRITE D(A5)
READ Q(A6)
WRITE D(A7)
DESELECT
DON'T CARE
UNDEFINED
Notes 28. For this waveform ZZ is tied low. 29. When CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 30. Order of the Burst sequence is determined by the status of the MODE (0 = Linear, 1 = Interleaved). Burst operations are optional.
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Switching Waveforms (continued)
Figure 6. NOP, STALL, and DESELECT Cycles[31, 32, 33]
1
CLK CEN CE ADV/LD WE BWx ADDRESS A1
2
3
4
5
6
7
8
9
10
A2
A3
A4
A5
t CHZ
Data In-Out (DQ)
WRITE D(A1) READ Q(A2) STALL
D(A1)
Q(A2)
Q(A3)
D(A4)
Q(A5)
READ Q(A3)
WRITE D(A4)
STALL
NOP
READ Q(A5)
DESELECT
CONTINUE DESELECT
DON'T CARE
UNDEFINED
Notes 31. For this waveform ZZ is tied low. 32. When CE is LOW, CE1 is LOW, CE2 is HIGH and CE3 is LOW. When CE is HIGH, CE1 is HIGH or CE2 is LOW or CE3 is HIGH. 33. The IGNORE CLOCK EDGE or STALL cycle (Clock 3) illustrated CEN being used to create a pause. A write is not performed during this cycle.
Document Number: 38-05538 Rev. *K
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CY7C1354C, CY7C1356C
Switching Waveforms (continued)
Figure 7. ZZ Mode Timing[34, 35]
CLK
t ZZ t ZZREC
ZZ
t
ZZI
I
SUPPLY I DDZZ t RZZI DESELECT or READ Only
A LL INPUTS (except ZZ)
Outputs (Q)
High-Z
DON'T CARE
Notes 34. Device must be deselected when entering ZZ mode. See cycle description table for all possible signal conditions to deselect the device. 35. I/Os are in high Z when exiting ZZ sleep mode.
Document Number: 38-05538 Rev. *K
Page 25 of 32
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CY7C1354C, CY7C1356C
Ordering Information
The table below contains only the parts that are currently available. If you don't see what you are looking for, please contact your local sales representative. For more information, visit the Cypress website at www.cypress.com and refer to the product summary page at http://www.cypress.com/products Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives and distributors. To find the office closest to you, visit us at http://www.cypress.com/go/datasheet/offices Speed (MHz) 166 Package Diagram Part and Package Type Operating Range Commercial
Ordering Code CY7C1354C-166AXC CY7C1356C-166AXC CY7C1354C-166BGC CY7C1356C-166BGC CY7C1354C-166AXI CY7C1356C-166AXI
51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-free 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-free 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-free 51-85115 119-ball Ball Grid Array (14 x 22 x 2.4 mm) 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-free 51-85050 100-pin Thin Quad Flat Pack (14 x 20 x 1.4 mm) Pb-free
Industrial Commercial Industrial Commercial
200
CY7C1354C-200AXC CY7C1354C-200BGC CY7C1354C-200AXI
250
CY7C1354C-250AXC CY7C1356C-250AXC
Ordering Code Definitions
CY 7C 135X C - XXX XX X Temperature Range: X = C or I C = Commercial I = Industrial Package Type: XX = AX or BG AX = 100-pin Thin Quad Flat Pack (Pb-free) BG = 119-ball Ball Grid Array Speed Grade: XXX = 166 MHz / 200 MHz / 250 MHz Process Technology 90 nm 135X = 1354 or 1356 1354 = PL, 256 Kb x 36 (9 Mb) 1356 = PL, 512 Kb x 18 (9 Mb) Marketing Code: 7C = SRAMs Company ID: CY = Cypress
Document Number: 38-05538 Rev. *K
Page 26 of 32
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CY7C1354C, CY7C1356C
Package Diagrams
Figure 8. 100-pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm), 51-85050
51-85050 *D
Document Number: 38-05538 Rev. *K
Page 27 of 32
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CY7C1354C, CY7C1356C
Figure 9. 119-ball BGA (14 x 22 x 2.4 mm), 51-85115
51-85115 *C
Document Number: 38-05538 Rev. *K
Page 28 of 32
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CY7C1354C, CY7C1356C
Figure 10. 165-ball FBGA (13 x 15 x 1.4 mm), 51-85180
51-85180 *C
Document Number: 38-05538 Rev. *K
Page 29 of 32
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CY7C1354C, CY7C1356C
Acronyms
Acronym BGA CMOS CE CEN FPBGA JTAG NoBL OE SRAM TCK TDI TMS TDO TQFP WE ball grid array complementary metal oxide semiconductor chip enable clock enable fine-pitch ball grid array Joint Test Action Group No Bus Latency output enable static random access memory test clock test data input test mode select test data output thin quad flat pack write enable V A mA ms MHz pF W C Description
Document Conventions
Units of Measure
Symbol ns nano seconds Volts micro Amperes milli Amperes milli seconds Mega Hertz pico Farad Watts degree Celcius Unit of Measure
Document Number: 38-05538 Rev. *K
Page 30 of 32
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CY7C1354C, CY7C1356C
Document History Page
Document Title: CY7C1354C/CY7C1356C 9-Mbit (256 K x 36/512 K x 18) Pipelined SRAM with NoBLTM Architecture Document Number: 38-05538 REV. ** *A ECN No. 242032 278130 Submission Date See ECN See ECN Orig. of Change RKF RKF New data sheet Changed Boundary Scan order to match the B Rev of these devices Changed TQFP pkg to Lead-free TQFP in Ordering Information section Added comment of Lead-free BG and BZ packages availability Changed ISB1 and ISB3 from DC Characteristic table as follows ISB1: 225 mA-> 130 mA, 200 MHz -> 120 mA, 167 MHz -> 110 mA ISB3: 225 MHz -> 120 mA, 200 MHz -> 110 mA, 167 MHz -> 100 mA Add BG and BZ pkg lead-free part numbers to ordering info section Changed 225 MHz to 250 MHz Address expansion pins/balls in the pinouts for all packages are modified as per JEDEC standard Unshaded frequencies of 250, 200, 166 MHz in AC/DC Tables and Selection Guide Changed JA and JC for TQFP Package from 25 and 9 C/W to 29.41 and 6.13 C/W respectively Changed JA and JC for BGA Package from 25 and 6 C/W to 34.1 and 14.0 C/W respectively Changed JA and JC for FBGA Package from 27 and 6 C/W to 16.8 and 3.0 C/W respectively Modified VOL, VOH test conditions Added Lead-Free product information Updated Ordering Information Table Changed from Preliminary to Final Changed ISB2 from 35 to 40 mA Updated Ordering Information Table Modified test condition in note# 15 from VDDQ < VDD to VDDQ VDD Changed address of Cypress Semiconductor Corporation on Page# 1 from "3901 North First Street" to "198 Champion Court" Changed three-state to tri-state. Modified "Input Load" to "Input Leakage Current except ZZ and MODE" in the Electrical Characteristics Table. Replaced Package Name column with Package Diagram in the Ordering Information table. Added the Maximum Rating for Supply Voltage on VDDQ Relative to GND Changed tTH, tTL from 25 ns to 20 ns and tTDOV from 5 ns to 10 ns in TAP AC Switching Characteristics table. Updated the Ordering Information table. Description of Change
*B
284431
See ECN
VBL
*C
320834
See ECN
PCI
*D *E *F
351895 377095 408298
See ECN See ECN See ECN
PCI PCI RXU
*G
501793
See ECN
VKN
*H
2756340
08/26/2009 VKN/AESA Updated template Included Soft Error Immunity Data Modified Ordering Information table by including parts that are available and modified the disclaimer for the Ordering information. 09/19/2010 NJY Added Ordering Code Definitions. Updated Package Diagrams. Added Acronyms and Units of Measure. Minor edits and updated in new template. Removed obsolete part numbers. Updated Ordering Information. Updated Package Diagrams.
*I
3033272
*J *K
3052882 3186089
10/08/2010 03/02/2011
NJY NJY
Document Number: 38-05538 Rev. *K
Page 31 of 32
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Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer's representatives, and distributors. To find the office closest to you, visit us at Cypress Locations.
Products
Automotive Clocks & Buffers Interface Lighting & Power Control Memory Optical & Image Sensing PSoC Touch Sensing USB Controllers Wireless/RF cypress.com/go/automotive cypress.com/go/clocks cypress.com/go/interface cypress.com/go/powerpsoc cypress.com/go/plc cypress.com/go/memory cypress.com/go/image cypress.com/go/psoc cypress.com/go/touch cypress.com/go/USB cypress.com/go/wireless
PSoC Solutions
psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 5
(c) Cypress Semiconductor Corporation, 2006-2011. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress' product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05538 Rev. *K
Revised March 2, 2011
Page 32 of 32
No Bus Latency and NoBL are trademarks of Cypress Semiconductor Corporation. All products and company names mentioned in this document may be the trademarks of their respective holders.
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